5570 search results - page 888 / 1114 » Applications of Fair Testing |
128
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ITC
2003
IEEE
15 years 10 months ago
2003
IEEE
When developing new designs, debugging the prototype is important to resolve application malfunction. During this board design debug, often a few pins of an IC are measured to che...
110
Voted
ITC
2003
IEEE
15 years 10 months ago
2003
IEEE
A scalable laser-based timing analysis technique we call laser assisted device alteration (LADA) is introduced for the rapid isolation and analysis of defect-free performance limi...
137
Voted
RTSS
2003
IEEE
15 years 10 months ago
2003
IEEE
Dynamic voltage scaling (DVS) algorithms save energy by scaling down the processor frequency when the processor is not fully loaded. Many algorithms have been proposed for periodi...
129
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VR
2003
IEEE
15 years 10 months ago
2003
IEEE
This paper describes the HOMERE system: a multimodal system dedicated to visually impaired people to explore and navigate inside virtual environments. The system addresses three m...
141
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IRAL
2003
ACM
15 years 10 months ago
2003
ACM
Recent years saw an increased interest in the use and the construction of large corpora. With this increased interest and awareness has come an expansion in the application to kno...