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CONSTRAINTS
2007
14 years 9 months ago
2007
In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
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JC
2008
14 years 9 months ago
2008
We study multivariate approximation for continuous functions in the average case setting. The space of d variate continuous functions is equipped with the zero mean Gaussian measu...
CORR
2007
Springer
14 years 9 months ago
2007
Springer
— In order to optimize the costs and time of design of the new products while improving their quality, concurrent engineering is based on the digital model of these products, the...
ISCA
2006
IEEE
14 years 9 months ago
2006
IEEE
Power density continues to increase exponentially with each new technology generation, posing a major challenge for thermal management in modern processors. Much past work has exa...
JMLR
2008
14 years 9 months ago
2008
In this paper we develop a theoretical analysis of the performance of sampling-based fitted value iteration (FVI) to solve infinite state-space, discounted-reward Markovian decisi...