6258 search results - page 255 / 1252 » Applied Text Generation |
154
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DATE
1999
IEEE
15 years 8 months ago
1999
IEEE
Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...
122
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CP
1999
Springer
15 years 8 months ago
1999
Springer
Column generation is a state-of-the-art method for optimally solving di cult large-scale optimization problems such as airline crew assignment. We show how to apply column generati...
137
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ICCAD
1998
IEEE
15 years 8 months ago
1998
IEEE
A method is presented for identifying primitive path-delay faults in non-scan sequential circuits and generating robust tests for all robustly testable primitive faults. It uses t...
122
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SACRYPT
1999
Springer
15 years 8 months ago
1999
Springer
In this paper, we introduce a new approach to the generation of binary sequences by applying trace functions to elliptic curves over GF 2m . We call these sequences elliptic curve...
126
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WCRE
1997
IEEE
15 years 8 months ago
1997
IEEE
We present an approach for the generation of components for a software renovation factory. These components are generated from a context-free grammar definition that recognizes t...