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DATE
2006
IEEE
111views Hardware» more  DATE 2006»
15 years 10 months ago
Functional test generation using property decompositions for validation of pipelined processors
Functional validation is a major bottleneck in pipelined processor design. Simulation using functional test vectors is the most widely used form of processor validation. While exi...
Heon-Mo Koo, Prabhat Mishra
ISQED
2002
IEEE
203views Hardware» more  ISQED 2002»
15 years 9 months ago
Automatic Test Program Generation from RT-Level Microprocessor Descriptions
The paper addresses the issue of microprocessor and microcontroller testing, and follows an approach based on the generation of a test program. The proposed method relies on two p...
Fulvio Corno, Gianluca Cumani, Matteo Sonza Reorda...
SIGMETRICS
1998
ACM
114views Hardware» more  SIGMETRICS 1998»
15 years 9 months ago
Generating Representative Web Workloads for Network and Server Performance Evaluation
One role for workload generation is as a means for understanding how servers and networks respond to variation in load. This enables management and capacity planning based on curr...
Paul Barford, Mark Crovella
ITC
1993
IEEE
110views Hardware» more  ITC 1993»
15 years 9 months ago
Novel Test Pattern Generators for Pseudo-Exhaustive Testing
ÐPseudoexhaustive testing of a combinational circuit involves applying all possible input patterns to all its individual output cones. The testing ensures detection of all detecta...
Rajagopalan Srinivasan, Sandeep K. Gupta, Melvin A...
ENTCS
2006
113views more  ENTCS 2006»
15 years 4 months ago
Concurrent Java Test Generation as a Search Problem
A Random test generator generates executable tests together with their expected results. In the form of a noise-maker, it seeds the program with conditional scheduling primitives ...
Yaniv Eytani