1682 search results - page 110 / 337 » Applying Conventional Testing Techniques for Class Testing |
131
Voted
SIGSOFT
2010
ACM
15 years 1 months ago
2010
ACM
Concurrent programs are notoriously difficult to debug. We see two main reasons for this: 1) concurrency bugs are often difficult to reproduce, 2) traces of buggy concurrent execu...
105
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DATE
2007
IEEE
15 years 10 months ago
2007
IEEE
Error-tolerance is an innovative way to enhance the effective yield of IC products. Previously a test methodology based on error-rate estimation to support error-tolerance was pro...
128
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GECCO
2004
Springer
15 years 9 months ago
2004
Springer
Abstract. In many real-world applications of evolutionary computation, it is essential to reduce the number of fitness evaluations. To this end, computationally efficient models c...
162
Voted
ISCAS
2007
IEEE
15 years 10 months ago
2007
IEEE
Due to the development of high speed circuits beyond the 2-GHz mark, the significance of automatic test pattern generation for Path Delay Faults (PDFs) drastically increased in t...
118
Voted
AAAI
2007
15 years 6 months ago
2007
We describe a technique for comparing distributions without the need for density estimation as an intermediate step. Our approach relies on mapping the distributions into a Reprod...