1682 search results - page 20 / 337 » Applying Conventional Testing Techniques for Class Testing |
126
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VLSID
2009
IEEE
16 years 3 months ago
2009
IEEE
We present the automatic test pattern generator TIGUAN based on a thread-parallel SAT solver. Due to a tight integration of the SAT engine into the ATPG algorithm and a carefully ...
133
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VLSI
2005
Springer
15 years 8 months ago
2005
Springer
1 The increasing test data volume required to ensure high test quality when testing a System-on-Chip is becoming a problem since it (the test data volume) must fit the ATE (Automa...
143
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ECBS
2010
IEEE
15 years 1 months ago
2010
IEEE
Software development and testing of Enterprise Resource Planning (ERP) systems demands dedicated methods to tackle its special features. As manual testing is not able to systematic...
152
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AIPR
2002
IEEE
15 years 8 months ago
2002
IEEE
Conventional remote sensing classification techniques that model the data in each class with a multivariate Gaussian distribution are inefficient, as this assumption is generally ...
102
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ITC
2000
IEEE
15 years 7 months ago
2000
IEEE
A common approachfor large industrial designs is to use logic built-in self-test (LBIST)followed by test data from an external tester. Because the fault coverage with LBIST alone ...