1682 search results - page 226 / 337 » Applying Conventional Testing Techniques for Class Testing |
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DATE
2006
IEEE
15 years 10 months ago
2006
IEEE
— In this paper, we present an analysis methodology to compute circuit node sensitivity due to charged particle induced delay (timing) errors, Soft Delay Errors (SDE). We define...
154
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AMFG
2005
IEEE
15 years 10 months ago
2005
IEEE
When applied to high-dimensional classification task such as face recognition, linear discriminant analysis (LDA) can extract two kinds of discriminant vectors, those in the null s...
132
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ICCAD
1992
IEEE
15 years 8 months ago
1992
IEEE
Excessive power dissipation in integrated circuits causes overheating and can lead to soft errors and or permanent damage. The severity of the problem increases in proportion to t...
132
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FLAIRS
2007
15 years 6 months ago
2007
Ontologies are an increasingly important tool in knowledge representation, as they allow large amounts of data to be related in a logical fashion. Current research is concentrated...
159
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RAID
2010
Springer
15 years 2 months ago
2010
Springer
Abstract. Malware attacks necessitate extensive forensic analysis efforts that are manual-labor intensive because of the analysis-resistance techniques that malware authors employ....