As the sizes of general and special purpose processors increase rapidly, generating high quality manufacturing tests which can be run at native speeds is becoming a serious proble...
Raghuram S. Tupuri, Arun Krishnamachary, Jacob A. ...
When implementingparallel programs forparallel computer systems the performancescalability of these programs should be tested and analyzed on different computer configurations and...
Allen D. Malony, Vassilis Mertsiotakis, Andreas Qu...
This paper presents a novel approach for automatic test pattern generation of asynchronous circuits. The techniques used for this purpose assume that the circuit can only be exerc...
In this paper, we propose a new prototype learning/matching method that can be combined with support vector machines (SVM) in pattern recognition. This hybrid method has the follo...
In last decades there have been many proposals from the machine learning community in the intrusion detection field. One of the main problems that Intrusion Detection Systems (IDSs...