Sciweavers

1682 search results - page 46 / 337
» Applying Conventional Testing Techniques for Class Testing
Sort
View
119
Voted
OOPSLA
2010
Springer
15 years 1 months ago
Random testing for higher-order, stateful programs
Testing is among the most effective tools available for finding bugs. Still, we know of no automatic technique for generating test cases that expose bugs involving a combination ...
Casey Klein, Matthew Flatt, Robert Bruce Findler
108
Voted
VLSID
2004
IEEE
139views VLSI» more  VLSID 2004»
16 years 3 months ago
Open Defects Detection within 6T SRAM Cells using a No Write Recovery Test Mode
The detection of all open defects within 6T SRAM cells is always a challenge due to the significant test time requirements. This paper proposes a new design-for-test (DFT) techniq...
André Ivanov, Baosheng Wang, Josh Yang
IJVR
2008
106views more  IJVR 2008»
15 years 3 months ago
Improved View Frustum Culling Technique for Real-Time Virtual Heritage Application
Real-time virtual heritage application is normally executed with a high performance computer system. This is due to the complexity and highly computational cost which makes such sy...
Mohd Shahrizal Sunar, Abdullah Mohd Zin, Tengku M....
134
Voted
ECAI
2006
Springer
15 years 7 months ago
Testing the Limits of Emergent Behavior in MAS Using Learning of Cooperative Behavior
Abstract. We present a method to test a group of agents for (unwanted) emergent behavior by using techniques from learning of cooperative behavior. The general idea is to mimick us...
Jordan Kidney, Jörg Denzinger
DAC
1994
ACM
15 years 7 months ago
Clock Grouping: A Low Cost DFT Methodology for Delay Testing
A low overhead DFT technique, called clock-grouping, for delay testing of sequential synchronous circuits is presented. The proposed technique increases robust path delay fault co...
Wen-Chang Fang, Sandeep K. Gupta