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» Applying Conventional Testing Techniques for Class Testing
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122
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DAC
2003
ACM
16 years 4 months ago
Coverage directed test generation for functional verification using bayesian networks
Functional verification is widely acknowledged as the bottleneck in the hardware design cycle. This paper addresses one of the main challenges of simulation based verification (or...
Shai Fine, Avi Ziv
133
Voted
KDD
2001
ACM
145views Data Mining» more  KDD 2001»
16 years 3 months ago
Proximal support vector machine classifiers
Given a dataset, each element of which labeled by one of k labels, we construct by a very fast algorithm, a k-category proximal support vector machine (PSVM) classifier. Proximal s...
Glenn Fung, Olvi L. Mangasarian
139
Voted
DAC
2003
ACM
15 years 8 months ago
Test generation for designs with multiple clocks
To improve the system performance, designs with multiple clocks have become more and more popular. In this paper, several novel test generation procedures are proposed to utilize ...
Xijiang Lin, Rob Thompson
147
Voted
ET
1998
52views more  ET 1998»
15 years 3 months ago
Scalable Test Generators for High-Speed Datapath Circuits
This paper explores the design of efficient test sets and test-pattern generators for online BIST. The target applications are high-performance, scalable datapath circuits for whi...
Hussain Al-Asaad, John P. Hayes, Brian T. Murray
135
Voted
APSEC
2004
IEEE
15 years 7 months ago
An Approach to Detecting Domain Errors Using Formal Specification-Based Testing
Domain testing, a technique for testing software or portions of software dominated by numerical processing, is intended to detect domain errors that usually arise from incorrect i...
Yuting Chen, Shaoying Liu