1682 search results - page 77 / 337 » Applying Conventional Testing Techniques for Class Testing |
130
Voted
GLVLSI
2002
IEEE
15 years 8 months ago
2002
IEEE
Design simplification is becoming necessary to respect the target time-to-market of SoCs, and this goal can be obtained by using predesigned IP-cores. However, their correct inte...
121
Voted
ICCAD
2006
IEEE
16 years 12 days ago
2006
IEEE
It has been shown that the delay of a target path can be composed linearly of other path delays. If the later paths are robustly testable (with known delay values), the target pat...
132
Voted
IOLTS
2007
IEEE
15 years 9 months ago
2007
IEEE
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
120
Voted
ICCD
1997
IEEE
15 years 7 months ago
1997
IEEE
: This paper studies pseudo-random pattern testing of bridging faults. Although bridging faults are generally more random pattern testable than stuck-at faults, examples are shown ...
125
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KDD
2006
ACM
16 years 3 months ago
2006
ACM
Outlier detection can uncover malicious behavior in fields like intrusion detection and fraud analysis. Although there has been a significant amount of work in outlier detection, ...