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DAC
2007
ACM
15 years 10 months ago
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
KDD
2006
ACM
164views Data Mining» more  KDD 2006»
15 years 10 months ago
Assessing data mining results via swap randomization
The problem of assessing the significance of data mining results on high-dimensional 0?1 data sets has been studied extensively in the literature. For problems such as mining freq...
Aristides Gionis, Heikki Mannila, Panayiotis Tsapa...
CIKM
2009
Springer
15 years 4 months ago
A social recommendation framework based on multi-scale continuous conditional random fields
This paper addresses the issue of social recommendation based on collaborative filtering (CF) algorithms. Social recommendation emphasizes utilizing various attributes informatio...
Xin Xin, Irwin King, Hongbo Deng, Michael R. Lyu
RECSYS
2009
ACM
15 years 4 months ago
Learning to recommend with trust and distrust relationships
With the exponential growth of Web contents, Recommender System has become indispensable for discovering new information that might interest Web users. Despite their success in th...
Hao Ma, Michael R. Lyu, Irwin King
SIGIR
2009
ACM
15 years 4 months ago
Learning to recommend with social trust ensemble
As an indispensable technique in the field of Information Filtering, Recommender System has been well studied and developed both in academia and in industry recently. However, mo...
Hao Ma, Irwin King, Michael R. Lyu