8 search results - page 2 / 2 » Arbitrary Two-Pattern Delay Testing Using a Low-Overhead Sup... |
ICCAD
2003
IEEE
14 years 3 months ago
2003
IEEE
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...
ICCD
2008
IEEE
14 years 3 months ago
2008
IEEE
—Dynamic voltage scaling (DVS) provides power savings for systems with varying performance requirements. One low overhead implementation of DVS uses PMOS power switches to connec...
18
Voted
ISLPED
2010
ACM
13 years 6 months ago
2010
ACM
We have developed a system architecture, measuring and modeling techniques, and algorithms for on-line power and energy optimization and thermal management. The starting point for...