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ICCAD
2008
IEEE
106views Hardware» more  ICCAD 2008»
14 years 3 months ago
Process variability-aware transient fault modeling and analysis
– Due to reduction in device feature size and supply voltage, the sensitivity of digital systems to transient faults is increasing dramatically. As technology scales further, the...
Natasa Miskov-Zivanov, Kai-Chiang Wu, Diana Marcul...
DAC
2009
ACM
14 years 7 months ago
Computing bounds for fault tolerance using formal techniques
Continuously shrinking feature sizes result in an increasing susceptibility of circuits to transient faults, e.g. due to environmental radiation. Approaches to implement fault tol...
André Sülflow, Görschwin Fey, Rol...
ATS
2000
IEEE
134views Hardware» more  ATS 2000»
13 years 10 months ago
Fsimac: a fault simulator for asynchronous sequential circuits
At very high frequencies, the major potential of asynchronous circuits is absence of clock skew and, through that, better exploitation of relative timing relations. This paper pre...
Susmita Sur-Kolay, Marly Roncken, Ken S. Stevens, ...
ITC
1989
IEEE
82views Hardware» more  ITC 1989»
13 years 10 months ago
CMOS IC Stuck-Open Fault Electrical Effects and Design Considerations
- The electrical effects of CMOS IC physical defects that caused stuck-openfaults are evaluated, including their voltage levels, quiescent power supply current (IDDQ), transient re...
Jerry M. Soden, R. Keith Treece, Michael R. Taylor...
DFT
1997
IEEE
93views VLSI» more  DFT 1997»
13 years 10 months ago
An IDDQ Sensor for Concurrent Timing Error Detection
Abstract— Error control is a major concern in many computer systems, particularly those deployed in critical applications. Experience shows that most malfunctions during system o...
Christopher G. Knight, Adit D. Singh, Victor P. Ne...