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DAC
2011
ACM
13 years 9 months ago
2011
ACM
As transistor dimensions continue to scale deep into the nanometer regime, silicon reliability is becoming a chief concern. At the same time, transistor counts are scaling up, ena...
DGO
2011
13 years 9 months ago
2011
The rising awareness of the challenges of preserving information over the long term has led to a wealth of initiatives developing economic models, methods, tools, systems, guideli...
179
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DOCENG
2011
ACM
13 years 9 months ago
2011
ACM
The growth of mobile phone users has lead to a dramatic increasing of SMS spam messages. In practice, fighting mobile phone spam is difficult by several factors, including the lo...
105
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DSN
2011
IEEE
13 years 9 months ago
2011
IEEE
—Aggressive technology scaling causes chip multiprocessors increasingly error-prone. Core-level faulttolerant approaches bind two cores to implement redundant execution and error...
199
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EMMCVPR
2011
Springer
13 years 9 months ago
2011
Springer
Length and area regularization are commonplace for inverse problems today. It has however turned out to be much more difficult to incorporate a curvature prior. In this paper we pr...