1113 search results - page 161 / 223 » Automated Approaches for Classifying Structures |
116
Voted
DAC
2007
ACM
16 years 4 months ago
2007
ACM
Due to increased variability trends in nanoscale integrated circuits, statistical circuit analysis has become essential. We present a novel method for post-silicon analysis that g...
106
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DAC
2005
ACM
16 years 4 months ago
2005
ACM
Existing Full-wave Model Order Reduction (FMOR) approaches are based on Expanded Taylor Series Approximations (ETAS) of the oscillatory full-wave system matrix. The accuracy of su...
124
Voted
ICSE
2009
IEEE-ACM
15 years 10 months ago
2009
IEEE-ACM
Regression test generation aims at generating a test suite that can detect behavioral differences between the original and the modified versions of a program. Regression test gen...
128
Voted
SEFM
2009
IEEE
15 years 10 months ago
2009
IEEE
Abstract. We introduce a visual notation for local specification of concurrent components based on message sequence charts (MSCs). Each component is a finite-state machine whose ...
142
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ICAS
2008
IEEE
15 years 10 months ago
2008
IEEE
This paper addresses the need for designing user interfaces (UIs) to workflow information systems by adopting a model-centric approach. We introduce a conceptual workflow model to...