1569 search results - page 139 / 314 » Automated Design Improvement by Example |
113
Voted
DAC
2000
ACM
16 years 4 months ago
2000
ACM
Contemporary microprocessors implement many iterative algorithms. For example, the front-end of a microprocessor repeatedly fetches and decodes instructions while updating interna...
107
Voted
TRIDENTCOM
2008
IEEE
15 years 10 months ago
2008
IEEE
This paper presents the setup of a testbed developed for the fast evaluation of RFID systems in two frequency domains. At the one hand the 13.56 MHz and at the other hand the 868 ...
127
Voted
EWLR
1997
Springer
15 years 7 months ago
1997
Springer
Building robots can be a tough job because the designer has to predict the interactions between the robot and the environment as well as to deal with them. One solution to cope the...
126
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ASAP
2003
IEEE
15 years 9 months ago
2003
IEEE
There is a growing demand for application-specific embedded processors in system-on-a-chip designs. Current tools and design methodologies often require designers to manually spec...
127
Voted
DAC
2008
ACM
16 years 4 months ago
2008
ACM
An effective technique to save power during scan based test is to switch off unused scan chains. The results obtained with this method strongly depend on the mapping of scan flip-...