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DAC
2009
ACM
16 years 4 days ago
Statistical reliability analysis under process variation and aging effects
Circuit reliability is affected by various fabrication-time and run-time effects. Fabrication-induced process variation has significant impact on circuit performance and reliabilit...
Yinghai Lu, Li Shang, Hai Zhou, Hengliang Zhu, Fan...
DAC
2004
ACM
16 years 3 days ago
ORACLE: optimization with recourse of analog circuits including layout extraction
Long design cycles due to the inability to predict silicon realities is a well-known problem that plagues analog/RF integrated circuit product development. As this problem worsens...
Yang Xu, Lawrence T. Pileggi, Stephen P. Boyd
86
Voted
DAC
2009
ACM
16 years 4 days ago
Contract-based system-level composition of analog circuits
Efficient system-level design is increasingly relying on hierarchical design-space exploration, as well as compositional methods, to shorten time-to-market, leverage design re-use...
Xuening Sun, Pierluigi Nuzzo, Chang-Ching Wu, Albe...
76
Voted
DAC
2004
ACM
16 years 3 days ago
Circuit-aware architectural simulation
Architectural simulation has achieved a prominent role in the system design cycle by providing designers the ability to quickly examine a wide variety of design choices. However, ...
Seokwoo Lee, Shidhartha Das, Valeria Bertacco, Tod...
DAC
2005
ACM
16 years 3 days ago
An effective power mode transition technique in MTCMOS circuits
- The large magnitude of supply/ground bounces, which arise from power mode transitions in power gating structures, may cause spurious transitions in a circuit. This can result in ...
Afshin Abdollahi, Farzan Fallah, Massoud Pedram