Starting from a model of the within-die systematic variations using principal components analysis, a model is proposed for estimation of the parametric yield, and is then applied ...
This paper shows a method to decompose a given multipleoutput circuit into two circuits with intermediate outputs. We use a BDD for characteristic function (BDD for CF) to represe...
We demonstrate how to use placement to ameliorate the predicted repeater explosion problem caused by poor interconnect scaling. We achieve repeater count reduction by dynamically ...
Brent Goplen, Prashant Saxena, Sachin S. Sapatneka...
We present a Mutation-based Validation Paradigm (MVP) technology that can handle complete high-level microprocessor implementations and is based on explicit design error modeling, ...
In this paper, we evaluate the dependencies between tools, data and environment in process design kits, and present a framework for systematically analyzing the quality of the des...