887 search results - page 124 / 178 » Automated Detection of Design Patterns |
110
click to vote
ATS
2010
IEEE
14 years 10 months ago
2010
IEEE
One of the most challenging problems in post-silicon validation is to identify those errors that cause prohibitive extra delay on speedpaths in the circuit under debug (CUD) and o...
DAC
2008
ACM
16 years 25 days ago
2008
ACM
An effective technique to save power during scan based test is to switch off unused scan chains. The results obtained with this method strongly depend on the mapping of scan flip-...
DAC
2003
ACM
16 years 24 days ago
2003
ACM
Cyclic circuits that do not hold state or oscillate are often the most convenient representation for certain functions, such as arbiters, and can easily be produced inadvertently ...
102
click to vote
ISSS
1999
IEEE
15 years 4 months ago
1999
IEEE
In order to cope with the ever increasing complexity of todays application specific integrated circuits, a building block based design methodology is established. The system is co...
114
click to vote
OOPSLA
2010
Springer
14 years 9 months ago
2010
Springer
This poster presents a design language and a tool suite covering the development life-cycle of a Sense/Compute/Control (SCC) application. This language makes it possible to define...