456 search results - page 64 / 92 » Automated Generation of Context-Aware Tests |
ITC
2002
IEEE
15 years 6 months ago
2002
IEEE
—Logic optimization is the step of the very large scale integration (VLSI) design cycle where the designer performs modifications on a design to satisfy different constraints suc...
117
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CONCUR
2006
Springer
15 years 5 months ago
2006
Springer
We describe an incomplete but sound and efficient livelock freedom test for infinite state asynchronous reactive systems. The method s a system into a set of simple control flow cy...
155
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IJSEKE
2011
14 years 5 months ago
2011
rather wide gap in abstraction between policies and mechanisms. In this paper, we propose a general approach for property verification for MAC models. The approach defines a stan...
167
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PLDI
2011
ACM
14 years 4 months ago
2011
ACM
Compilers should be correct. To improve the quality of C compilers, we created Csmith, a randomized test-case generation tool, and spent three years using it to find compiler bug...
124
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DAC
2002
ACM
16 years 2 months ago
2002
ACM
At-speed testing of high-speed circuits is becoming increasingly difficult with external testers due to the growing gap between design and tester performance, growing cost of high...