1414 search results - page 31 / 283 » Automated Metamorphic Testing |
ITNG
2010
IEEE
15 years 8 months ago
2010
IEEE
115
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DATE
2002
IEEE
15 years 8 months ago
2002
IEEE
Models meant for logic verification and simulation are often used for ATPG. For custom digital circuits, these models contain many tristate devices, which leads to lower fault co...
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ICSE
2009
IEEE-ACM
15 years 7 months ago
2009
IEEE-ACM
ICSE
2009
IEEE-ACM
15 years 7 months ago
2009
IEEE-ACM
99
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ICSE
2009
IEEE-ACM
15 years 7 months ago
2009
IEEE-ACM
