1680 search results - page 31 / 336 » Automated Model Selection for Simulation |
WSC
2007
15 years 3 days ago
2007
The transition to 300mm wafer size introduced a lot of new technologies to wafer fabrication facilities that mandated the presence of intrabay automated material handling systems ...
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WSC
2007
15 years 3 days ago
2007
Semiconductor wafer fabrication facilities (wafer fabs) are among the most complex production facilities. A large product variety, hundreds of processing steps per product, hundre...
DAC
2003
ACM
15 years 10 months ago
2003
ACM
We describe a technique for verifying that a hardware design correctly implements a protocol-level formal specification. Simulation steps are translated to protocol state transiti...
GECCO
2008
Springer
14 years 11 months ago
2008
Springer
Standard tournament selection samples individuals with replacement. The sampling-with-replacement strategy has its advantages but also has issues. One of the commonly recognised i...
ICIAR
2004
Springer
15 years 3 months ago
2004
Springer
The automated flaw detection in aluminium castings consists of two steps: a) identification of potential defects using image processing techniques, and b) classification of pote...