119 search results - page 12 / 24 » Automated Modeling of Custom Digital Circuits for Test |
CASES
2006
ACM
15 years 5 months ago
2006
ACM
Designers of SoCs with non-digital components, such as analog or MEMS devices, can currently use high-level system design languages, such as SystemC, to model only the digital par...
ASP
2001
Springer
15 years 3 months ago
2001
Springer
In this paper bounded model checking of asynchronous concurrent systems is introduced as a promising application area for answer set programming. This is an extension of earlier w...
107
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JCP
2007
14 years 11 months ago
2007
—This paper describes an Internet-based laboratory, named Remote Monitored and Controlled Laboratory (RMCLab) developed at University of Patras, Greece, for electrical engineerin...
103
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FPGA
2010
ACM
14 years 9 months ago
2010
ACM
Metastability is a phenomenon that can cause system failures in digital circuits. It may occur whenever signals are being transmitted across asynchronous or unrelated clock domain...
DAC
2000
ACM
16 years 9 days ago
2000
ACM
The effect of crosstalk errors is most significant in highperformance circuits, mandating at-speed testing for crosstalk defects. This paper describes a self-test methodology that...