Sciweavers

119 search results - page 14 / 24
» Automated Modeling of Custom Digital Circuits for Test
Sort
View
JAIR
2010
165views more  JAIR 2010»
14 years 9 months ago
A Model-Based Active Testing Approach to Sequential Diagnosis
Model-based diagnostic reasoning often leads to a large number of diagnostic hypotheses. The set of diagnoses can be reduced by taking into account extra observations (passive mon...
Alexander Feldman, Gregory M. Provan, Arjan J. C. ...
DAC
2004
ACM
16 years 9 days ago
A scalable soft spot analysis methodology for compound noise effects in nano-meter circuits
Circuits using nano-meter technologies are becoming increasingly vulnerable to signal interference from multiple noise sources as well as radiation-induced soft errors. One way to...
Chong Zhao, Xiaoliang Bai, Sujit Dey
ISQED
2011
IEEE
240views Hardware» more  ISQED 2011»
14 years 2 months ago
Fast optimization of nano-CMOS mixed-signal circuits through accurate metamodeling
—Design optimization methodologies for AMS-SoCs with analog, digital, and mixed-signal portions have not received significant attention, due to their high complexity. In mixed-s...
Oleg Garitselov, Saraju P. Mohanty, Elias Kougiano...
EMSOFT
2008
Springer
15 years 1 months ago
Randomized directed testing (REDIRECT) for Simulink/Stateflow models
The Simulink/Stateflow (SL/SF) environment from Mathworks is becoming the de facto standard in industry for model based development of embedded control systems. Many commercial to...
Manoranjan Satpathy, Anand Yeolekar, S. Ramesh
DFT
2007
IEEE
109views VLSI» more  DFT 2007»
15 years 5 months ago
Safety Evaluation of NanoFabrics
Chemically Assembled Electronic Nanotechnology is a promising alternative to CMOS fabrication. In particular, the nanoFabric has proven to be a viable solution for implementing di...
Michelangelo Grosso, Maurizio Rebaudengo, Matteo S...