119 search results - page 5 / 24 » Automated Modeling of Custom Digital Circuits for Test |
DATE
2000
IEEE
15 years 3 months ago
2000
IEEE
Process variation has forever been the major fail cause of analog circuit where small deviations in component values cause large deviations in the measured output parameters. This...
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MSS
1999
IEEE
15 years 3 months ago
1999
IEEE
Benchmark tests have been designed and conducted for the purpose of evaluating the use of automated tape libraries in on-line digital check image retrieval applications. This type...
ACSD
2005
IEEE
15 years 5 months ago
2005
IEEE
Register Transfer Level (RTL) synthesis model which simplified the design of clocked circuits allowed design automation boost and VLSI progress for more than a decade. Shrinking t...
AUSAI
2006
Springer
15 years 3 months ago
2006
Springer
Abstract. In order to apply nonmonotonic logics for specifying industrial automation controllers, we define (1) a method to extend atemporal nonmonotonic logics with temporal opera...
VLSID
2005
IEEE
15 years 4 months ago
2005
IEEE
Microfluidics-based biochips offer a promising platform for massively parallel DNA analysis, automated drug discovery, and real-time biomolecular recognition. The first part of th...