119 search results - page 8 / 24 » Automated Modeling of Custom Digital Circuits for Test |
DAC
2000
ACM
16 years 9 days ago
2000
ACM
Substrate noise caused by large digital circuits will degrade the performance of analog circuits located on the same substrate. To simulate this performance degradation, the total...
ICIS
2004
15 years 22 days ago
2004
The effective management of digital rights is a crucial challenge in many industries making the transition from physical to digital products. We present an economic model that cha...
DAC
1994
ACM
15 years 3 months ago
1994
ACM
Today's high-performance single-chip CMOS microprocessors are the most complex and challenging chip designs ever implemented. To stay on the leading edge, Digital's micro...
ICCAD
2006
IEEE
15 years 8 months ago
2006
IEEE
— Trajectory-based methods offer an attractive methodology for automated, on-demand generation of macromodels for custom circuits. These models are generated by sampling the stat...
ITC
2003
IEEE
15 years 4 months ago
2003
IEEE
Test model generation is crucial in the test generation process of a high-performance design targeted for large volume production. A key process in test model generation requires ...