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CERA
2002
134views more  CERA 2002»
15 years 5 months ago
Graph Grammar Based Product Family Modeling
: Many industries are shifting from mass production to mass customization, which demands quick response to the needs of individual customers with high quality and low costs. The de...
Xuehong Du, Jianxin Jiao, Mitchell M. Tseng
DAC
2009
ACM
16 years 6 months ago
Statistical reliability analysis under process variation and aging effects
Circuit reliability is affected by various fabrication-time and run-time effects. Fabrication-induced process variation has significant impact on circuit performance and reliabilit...
Yinghai Lu, Li Shang, Hai Zhou, Hengliang Zhu, Fan...
DAC
2009
ACM
16 years 6 months ago
Spectral techniques for high-resolution thermal characterization with limited sensor data
Elevated chip temperatures are true limiters to the scalability of computing systems. Excessive runtime thermal variations compromise the performance and reliability of integrated...
Ryan Cochran, Sherief Reda
DAC
2009
ACM
16 years 6 months ago
Analysis and mitigation of process variation impacts on Power-Attack Tolerance
Embedded cryptosystems show increased vulnerabilities to implementation attacks such as power analysis. CMOS technology trends are causing increased process variations which impac...
Lang Lin, Wayne P. Burleson
DAC
2007
ACM
16 years 6 months ago
Fast Second-Order Statistical Static Timing Analysis Using Parameter Dimension Reduction
The ability to account for the growing impacts of multiple process variations in modern technologies is becoming an integral part of nanometer VLSI design. Under the context of ti...
Zhuo Feng, Peng Li, Yaping Zhan