4359 search results - page 689 / 872 » Automated Pipeline Design |
158
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DAC
2003
ACM
16 years 6 months ago
2003
ACM
Skin effect makes interconnect resistance and inductance frequency dependent. This paper addresses the problem of efficiently estimating the signal characteristics of any RLC netw...
134
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DAC
2004
ACM
16 years 6 months ago
2004
ACM
We present novel and efficient methods for on-line testing in FPGAs. The testing approach uses a ROving TEster (ROTE), which has provable diagnosabilities and is also faster than ...
146
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DAC
2004
ACM
16 years 6 months ago
2004
ACM
Circuits using nano-meter technologies are becoming increasingly vulnerable to signal interference from multiple noise sources as well as radiation-induced soft errors. One way to...
156
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DAC
2005
ACM
16 years 6 months ago
2005
ACM
In this work, we propose a new paradigm called power emulation, which exploits hardware acceleration to drastically speedup power estimation. Power emulation is based on the obser...
146
click to vote
DAC
2005
ACM
16 years 6 months ago
2005
ACM
As technology advances into the nanometer territory, the interconnect delay has become a first-order effect on chip performance. To handle this effect, the X-architecture has been...