In this paper we present an efficient algorithm for extracting the complete statistical distribution of the input impedance of interconnect structures in the presence of a large n...
1 Soft errors induced by radiation are an increasing problem in the microelectronic field. Although traditional models estimate the reliability of memories suffering Single Event U...
Many computational tools have recently begun to benefit from the use of the symmetry inherent in the tasks they solve, and use general-purpose graph symmetry tools to uncover this...
We consider the problem of optimizing the performance of a latency-insensitive system (LIS) where the addition of backpressure has caused throughput degradation. Previous works ha...
The complexity and physical distribution of modern active-safety automotive applications requires the use of distributed architectures. These architectures consist of multiple ele...
Abhijit Davare, Qi Zhu, Marco Di Natale, Claudio P...