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78
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DAC
2006
ACM
15 years 10 months ago
Gate sizing: finFETs vs 32nm bulk MOSFETs
FinFET devices promise to replace traditional MOSFETs because of superior ability in controlling leakage and minimizing short channel effects while delivering a strong drive curre...
Brian Swahn, Soha Hassoun
DAC
2006
ACM
15 years 10 months ago
SAT sweeping with local observability don't-cares
SAT sweeping is a method for simplifying an AND/INVERTER graph (AIG) by systematically merging graph vertices from the inputs towards the outputs using a combination of structural...
Qi Zhu, Nathan Kitchen, Andreas Kuehlmann, Alberto...
NDSS
2008
IEEE
15 years 4 months ago
Automated Whitebox Fuzz Testing
Fuzz testing is an effective technique for finding security vulnerabilities in software. Traditionally, fuzz testing tools apply random mutations to well-formed inputs of a progr...
Patrice Godefroid, Michael Y. Levin, David A. Moln...
DAC
1999
ACM
15 years 10 months ago
A Practical Gate Resizing Technique Considering Glitch Reduction for Low Power Design
We propose a method for power optimization that considers glitch reduction by gate sizing based on the statistical estimation of glitch transitions. Our method reduces not only th...
Masanori Hashimoto, Hidetoshi Onodera, Keikichi Ta...
96
Voted
DAC
2008
ACM
14 years 11 months ago
Leakage power-aware clock skew scheduling: converting stolen time into leakage power reduction
Clock skew scheduling has been traditionally considered as a tool for improving the clock period in a sequential circuit. Timing slack is "stolen" from fast combinationa...
Min Ni, Seda Ogrenci Memik