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ICCD
2006
IEEE
105views Hardware» more  ICCD 2006»
15 years 5 months ago
A New Class of Sequential Circuits with Acyclic Test Generation Complexity
—This paper introduces a new class of sequential circuits called acyclically testable sequential circuits which is wider than the class of acyclic sequential circuits but whose t...
Chia Yee Ooi, Hideo Fujiwara
ISSRE
2003
IEEE
15 years 5 months ago
Investigating Java Type Analyses for the Receiver-Classes Testing Criterion
This paper investigates the precision of three linearcomplexity type analyses for Java software: Class Hierarchy Analysis (CHA), Rapid Type Analysis (RTA) and Variable Type Analys...
Pierre-Luc Brunelle, Ettore Merlo, Giuliano Antoni...
CORR
2008
Springer
108views Education» more  CORR 2008»
14 years 11 months ago
Efficient Isomorphism Testing for a Class of Group Extensions
Abstract. The group isomorphism problem asks whether two given groups are isomorphic or not. Whereas the case where both groups are abelian is well understood and can be solved eff...
François Le Gall
DATE
2003
IEEE
75views Hardware» more  DATE 2003»
15 years 5 months ago
Self-Testing Embedded Checkers for Bose-Lin, Bose, and a Class of Borden Codes
—A new approach for designing t-UED and BUED code checkers is presented. In particular we consider Borden codes for t = 2k − 1, Bose and Bose-Lin codes. The design technique fo...
Steffen Tarnick
IJCSA
2007
91views more  IJCSA 2007»
14 years 11 months ago
Experiences in Testing Automation of a Family of Functional- and GUI-similar Programs
This article presents experiences in the automation of a testing process. The main goal is the unified testing of not only one program, but a whole family of programs. The family ...
Anna Derezinska, Tomasz Malek