7213 search results - page 1352 / 1443 » Automated model grouping |
143
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DAC
2009
ACM
16 years 5 months ago
2009
ACM
Embedded cryptosystems show increased vulnerabilities to implementation attacks such as power analysis. CMOS technology trends are causing increased process variations which impac...
138
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DAC
2007
ACM
16 years 5 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
123
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DAC
2007
ACM
16 years 5 months ago
2007
ACM
It is now common for multimedia applications to be partitioned and mapped onto multiple processing elements of a system-on-chip architecture. An important design constraint in suc...
144
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DAC
2005
ACM
16 years 5 months ago
2005
ACM
We obtain analytically, the energy optimal speed profile of a generic multi-speed device with a discrete set of speeds, to execute a given task within a given time. Current implem...
164
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DAC
2005
ACM
16 years 5 months ago
2005
ACM
The challenge of verifying a modern microprocessor design is an overwhelming one: Increasingly complex micro-architectures combined with heavy time-to-market pressure have forced ...