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» Automated path generation for software fault localization
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135
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KBSE
2007
IEEE
15 years 10 months ago
Context-aware statistical debugging: from bug predictors to faulty control flow paths
Effective bug localization is important for realizing automated debugging. One attractive approach is to apply statistical techniques on a collection of evaluation profiles of pr...
Lingxiao Jiang, Zhendong Su
141
Voted
DATE
1999
IEEE
111views Hardware» more  DATE 1999»
15 years 8 months ago
Sequential Circuit Test Generation Using Decision Diagram Models
A novel approach to testing sequential circuits that uses multi-level decision diagram representations is introduced. The proposed algorithm consists of a combination of scanning ...
Jaan Raik, Raimund Ubar
149
Voted
ISSTA
2010
ACM
15 years 7 months ago
Automated fixing of programs with contracts
In program debugging, finding a failing run is only the first step; what about correcting the fault? Can we automate the second task as well as the first? The AutoFix-E tool au...
Yi Wei, Yu Pei, Carlo A. Furia, Lucas S. Silva, St...
125
Voted
ISSRE
2008
IEEE
15 years 10 months ago
Automated Generation of Pointcut Mutants for Testing Pointcuts in AspectJ Programs
Aspect-Oriented Programming (AOP) provides new modularization of software systems by encapsulating crosscutting concerns. AspectJ, an AOP language, uses abstractions such as point...
Prasanth Anbalagan, Tao Xie
135
Voted
ET
2000
145views more  ET 2000»
15 years 3 months ago
Fast Test Pattern Generation for Sequential Circuits Using Decision Diagram Representations
The paper presents a novel hierarchical approach to test pattern generation for sequential circuits based on an input model of mixed-level decision diagrams. A method that handles,...
Jaan Raik, Raimund Ubar