The integration of scalable performance analysis in parallel development tools is difficult. The potential size of data sets and the need to compare results from multiple experime...
Kevin A. Huck, Allen D. Malony, Sameer Shende, Ala...
A critical aspect of semiconductor manufacturing is the design and analysis of material handling and production control polices to optimize fab performance. As wafer sizes have in...
This paper describes a technique for automating the size estimation of software projects conducted using Model Driven Development methods. Specifically, an algorithm has been impl...
We propose a new method to control memory resources by static analysis. For this, we introduce the notion of sup-interpretation which bounds from above the size of function outputs...
Program analysis and automated test generation have primarily been used to find correctness bugs. We present complexity testing, a novel automated test generation technique to ...