7 search results - page 2 / 2 » Automated test development and test time reduction for RF su... |
ICNP
1999
IEEE
13 years 10 months ago
1999
IEEE
In this paper we present a new approach for the automated mapping of formal descriptions into activity thread implementations. Our approach resolves semantic conflicts by reorderi...
DAC
2003
ACM
14 years 7 months ago
2003
ACM
Chemical-mechanical planarization (CMP) and other manufacturing steps in very deep-submicron VLSI have varying effects on device and interconnect features, depending on the local ...