270 search results - page 19 / 54 » Automated test generation for industrial Erlang applications |
133
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IFIP
2001
Springer
15 years 4 months ago
2001
Springer
— Semi-formal verification based on symbolic simulation offers a good compromise between formal model checking and numerical simulation. The generation of functional test vector...
113
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EVOW
2001
Springer
15 years 4 months ago
2001
Springer
The integrated circuits design flow is rapidly moving towards higher description levels. However, test-related activities are lacking behind this trend, mainly since effective faul...
102
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KBSE
2007
IEEE
15 years 6 months ago
2007
IEEE
We explore the automatic generation of test data that respect constraints expressed in the Object-Role Modeling (ORM) language. ORM is a popular conceptual modeling language, prim...
118
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GECCO
2004
Springer
15 years 5 months ago
2004
Springer
Abstract. The need for effective testing techniques for architectural level descriptions is widely recognised. However, due to the variety of domain-specific architectural descript...
120
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CORR
2007
Springer
14 years 11 months ago
2007
Springer
This paper presents a methodology to efficiently explore the design space of communication adapters. In most digital signal processing (DSP) applications, the overall performance ...