270 search results - page 20 / 54 » Automated test generation for industrial Erlang applications |
PTS
1998
15 years 1 months ago
1998
Based on the notion of event-based behavioral abstraction EBBA we specify properties of object-oriented distributed systems in linear time temporal logic. These properties are the...
SIGSOFT
2007
ACM
16 years 15 days ago
2007
ACM
There has recently been a great deal of interest in search? based test data generation, with many local and global search algorithms being proposed. However, to date, there has be...
KES
2007
Springer
15 years 5 months ago
2007
Springer
This multidisciplinary study focuses on the application and comparison of several topology preserving mapping models upgraded with some classifier ensemble and boosting techniques ...
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DAC
2003
ACM
15 years 5 months ago
2003
ACM
We present a novel method to efficiently generate, compress and apply test patterns in a logic BIST architecture. Patterns are generated by a modified automatic test pattern gener...
VLSID
2005
IEEE
16 years 4 days ago
2005
IEEE
Abstract-- We present two-dimensional (space/time) compression techniques that reduce test data volume and test application time for scan testing of intellectual property (IP) core...