270 search results - page 38 / 54 » Automated test generation for industrial Erlang applications |
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FCCM
2011
IEEE
14 years 3 months ago
2011
IEEE
—The problem of automatically generating hardware modules from a high level representation of an application has been at the research forefront in the last few years. In this pap...
ITC
2002
IEEE
15 years 4 months ago
2002
IEEE
—Logic optimization is the step of the very large scale integration (VLSI) design cycle where the designer performs modifications on a design to satisfy different constraints suc...
CONCUR
2006
Springer
15 years 3 months ago
2006
Springer
We describe an incomplete but sound and efficient livelock freedom test for infinite state asynchronous reactive systems. The method s a system into a set of simple control flow cy...
ATAL
2005
Springer
15 years 5 months ago
2005
Springer
Different driving forces push the electricity production towards decentralization. As a result, the current electricity infrastructure is expected to evolve into a network of netw...
ICDM
2003
IEEE
15 years 5 months ago
2003
IEEE
Analyzing data to find trends, correlations, and stable patterns is an important problem for many industrial applications. In this paper, we propose a new technique based on paral...