5 search results - page 1 / 1 » Automatic Design Pattern Detection |
121
click to vote
HPCA
1998
IEEE
15 years 6 months ago
1998
IEEE
As we look to the future, and the prospect of a billion transistors on a chip, it seems inevitable that microprocessors will exploit having multiple parallel threads. To achieve t...
147
click to vote
HPCA
2012
IEEE
13 years 10 months ago
2012
IEEE
The least recently used (LRU) replacement policy performs poorly in the last-level cache (LLC) because temporal locality of memory accesses is filtered by first and second level...
114
click to vote
HPCA
2001
IEEE
16 years 2 months ago
2001
IEEE
Network performance in tightly-coupled multiprocessors typically degrades rapidly beyond network saturation. Consequently, designers must keep a network below its saturation point...
108
click to vote
HPCA
2008
IEEE
16 years 2 months ago
2008
IEEE
Estimating the maximum power and thermal characteristics of a processor is essential for designing its power delivery system, packaging, cooling, and power/thermal management sche...
144
click to vote
HPCA
2006
IEEE
16 years 2 months ago
2006
IEEE
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...