109 search results - page 17 / 22 » Automatic Fault Detection for 3D Seismic Data |
IOLTS
2008
IEEE
15 years 4 months ago
2008
IEEE
Present and future semiconductor technologies are characterized by increasing parameters variations as well as an increasing susceptibility to external disturbances. Transient err...
75
Voted
HICSS
2003
IEEE
15 years 2 months ago
2003
IEEE
This paper presents the time domain and timefrequency domain analysis results of incipient events in single-phase distribution transformers. This analysis will aid in the developm...
DMIN
2009
14 years 7 months ago
2009
This paper proposes a new method to detect abnormal process state. The method is based on cluster center point monitoring in time and is demonstrated in its application to data fro...
ICST
2010
IEEE
14 years 7 months ago
2010
IEEE
A Feature Model (FM) is a compact representation of all the products of a software product line. The automated extraction of information from FMs is a thriving research topic invo...
ISCA
2009
IEEE
15 years 4 months ago
2009
IEEE
Detecting data races in parallel programs is important for both software development and production-run diagnosis. Recently, there have been several proposals for hardware-assiste...