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ISSRE
2003
IEEE
15 years 11 months ago
Exploiting Symmetries to Test Programs
Symmetries often appear as properties of many artifical settings. In Program Testing, they can be viewed as properties of programs and can be given by the tester to check the cor...
Arnaud Gotlieb
ISSRE
2003
IEEE
15 years 11 months ago
A New Software Testing Approach Based on Domain Analysis of Specifications and Programs
Partition testing is a well-known software testing technique. This paper shows that partition testing strategies are relatively ineffective in detecting faults related to small sh...
Ruilian Zhao, Michael R. Lyu, Yinghua Min
ITC
2003
IEEE
139views Hardware» more  ITC 2003»
15 years 11 months ago
Fault Pattern Oriented Defect Diagnosis for Memories
Failure analysis (FA) and diagnosis of memory cores plays a key role in system-on-chip (SOC) product development and yield ramp-up. Conventional FA based on bitmaps and the experi...
Chih-Wea Wang, Kuo-Liang Cheng, Jih-Nung Lee, Yung...
MSE
2003
IEEE
104views Hardware» more  MSE 2003»
15 years 11 months ago
Internet-based Tool for System-on-Chip Integration
A tool has been created for use in a design course to automate integration of new components into a SystemOn-Chip (SoC). Students used this tool to implement a complete SoC Intern...
David Lim, Christopher E. Neely, Christopher K. Zu...
PG
2003
IEEE
15 years 11 months ago
Lightweight Face Relighting
In this paper we present a method to relight human faces in real time, using consumer-grade graphics cards even with limited 3D capabilities. We show how to render faces using a c...
Sylvain Paris, François X. Sillion, Long Qu...