41 search results - page 5 / 9 » Automatic Generation of Synchronous Test Patterns for Asynch... |
84
Voted
DDECS
2007
IEEE
15 years 6 months ago
2007
IEEE
— Recently, there is a renewed interest in Automatic Test Pattern Generation (ATPG) based on Boolean Satisfiability (SAT). This results from the availability of very powerful SA...
119
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EVOW
2001
Springer
15 years 4 months ago
2001
Springer
The integrated circuits design flow is rapidly moving towards higher description levels. However, test-related activities are lacking behind this trend, mainly since effective faul...
122
Voted
ISCAS
2007
IEEE
15 years 6 months ago
2007
IEEE
Due to the development of high speed circuits beyond the 2-GHz mark, the significance of automatic test pattern generation for Path Delay Faults (PDFs) drastically increased in t...
120
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ATS
2003
IEEE
15 years 5 months ago
2003
IEEE
We present a framework for high-level design validation using an efficient register-transfer level (RTL) automatic test pattern generator (ATPG). The RTL ATPG generates the test ...
110
Voted
TCAD
1998
14 years 12 months ago
1998
—We study the effect of the controller on the testability of sequential circuits composed of controllers and data paths. We show that even when all the loops of the circuit have ...