42 search results - page 7 / 9 » Automatic Test Pattern Generation for Resistive Bridging Fau... |
103
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INTEGRATION
2006
14 years 9 months ago
2006
Improving testability during the early stages of high-level synthesis has several benefits including reduced test hardware overheads, reduced test costs, reduced design iterations...
100
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DAC
2003
ACM
15 years 2 months ago
2003
ACM
We present a novel method to efficiently generate, compress and apply test patterns in a logic BIST architecture. Patterns are generated by a modified automatic test pattern gener...
DDECS
2007
IEEE
15 years 3 months ago
2007
IEEE
— Recently, there is a renewed interest in Automatic Test Pattern Generation (ATPG) based on Boolean Satisfiability (SAT). This results from the availability of very powerful SA...
ATS
2009
IEEE
15 years 4 months ago
2009
IEEE
SAT-based automatic test pattern generation has several advantages compared to conventional structural procedures, yet often yields too large test sets. We present a dynamic compa...
SIGSOFT
2006
ACM
15 years 3 months ago
2006
ACM
Unit test cases are focused and efficient. System tests are effective at exercising complex usage patterns. Differential unit tests (DUT) are a hybrid of unit and system tests. T...