42 search results - page 8 / 9 » Automatic Test Pattern Generation for Resistive Bridging Fau... |
DDECS
2009
IEEE
15 years 4 months ago
2009
IEEE
—Automatic Test Pattern Generation (ATPG) based on Boolean satisfiability (SAT) has been shown to be a beneficial complement to traditional ATPG techniques. Boolean solvers wor...
ASPDAC
2001
ACM
15 years 1 months ago
2001
ACM
Ethernet communication devices, such as adapter, hub, bridge and switch, all follow IEEE 802.3 standard protocol. We have designed and implemented an integrated 10/100 Mbps Etherne...
TCAD
2011
14 years 4 months ago
2011
—This paper presents a hybrid automatic test pattern generation (ATPG) technique using the staggered launch-oncapture (LOC) scheme followed by the one-hot LOC scheme for testing ...
ICCAD
2002
IEEE
15 years 6 months ago
2002
IEEE
In this survey, we outline basic SAT- and ATPGprocedures as well as their applications in formal hardware verification. We attempt to give the reader a trace trough literature and...
ITC
1999
IEEE
15 years 1 months ago
1999
IEEE
This paper discusses practical issues involved in applying logic built-in self-test (BIST) to four large industrial designs. These multi-clock designs, ranging in size from 200K t...