119 search results - page 5 / 24 » Automatic Testing of Higher Order Functions |
KBSE
2005
IEEE
15 years 5 months ago
2005
IEEE
Test factoring creates fast, focused unit tests from slow system-wide tests; each new unit test exercises only a subset of the functionality exercised by the system test. Augmenti...
141
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JAVACARD
2000
15 years 3 months ago
2000
: Open-cards have introduced a new life cycle for smart card embedded applications. In the case of Java Card, they have raised the problem of embedded object-oriented applet valida...
ICASSP
2011
IEEE
14 years 3 months ago
2011
IEEE
In this work we concentrate on generating compound words with high order n-gram information for speech recognition. In most existing compound words generation methods, only bi-gra...
149
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JMLR
2012
13 years 2 months ago
2012
Models such as pairwise conditional random fields (CRFs) are extremely popular in computer vision and various other machine learning disciplines. However, they have limited expre...
ECBS
2010
IEEE
15 years 4 months ago
2010
IEEE
The Unified Modeling Language (UML) is the standard to specify the structure and behaviour of software systems. The created models are a constitutive part of the software speci...