315 search results - page 15 / 63 » Automatic generation of high coverage usability tests |
ITC
1995
IEEE
15 years 3 months ago
1995
IEEE
During built-in self-test (BIST), the set of patterns generated by a pseudo-random pattern generator may not provide a sufficiently high fault coverage. This paper presents a new ...
VTS
1999
IEEE
15 years 4 months ago
1999
IEEE
High-level test pattern generation is today a widely investigated research topic. The present paper proposes a fully automated, simulation-based ATPG system, to address test patte...
FORMATS
2003
Springer
15 years 5 months ago
2003
Springer
Testing is the primary software validation technique used by industry today, but remains ad hoc, error prone, and very expensive. A promising improvement is to automatically genera...
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ATS
1998
IEEE
15 years 4 months ago
1998
IEEE
This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...
JSS
2008
14 years 11 months ago
2008
Search-based test-data generation has proved successful for code-level testing but almost no search-based work has been carried out at evels of abstraction. In this paper the appl...