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COMPSAC
2010
IEEE
13 years 4 months ago
GenRed: A Tool for Generating and Reducing Object-Oriented Test Cases
An important goal of automatic testing techniques, including random testing is to achieve high code coverage with a minimum set of test cases. To meet this goal, random testing res...
Hojun Jaygarl, Kai-Shin Lu, Carl K. Chang
ITC
1998
IEEE
95views Hardware» more  ITC 1998»
13 years 10 months ago
Native mode functional test generation for processors with applications to self test and design validation
New methodologies based on functional testing and built-in self-test can narrow the gap between necessary solutions and existing techniques for processor validation and testing. W...
Jian Shen, Jacob A. Abraham
DAC
1997
ACM
13 years 10 months ago
Automatic Generation of Synchronous Test Patterns for Asynchronous Circuits
This paper presents a novel approach for automatic test pattern generation of asynchronous circuits. The techniques used for this purpose assume that the circuit can only be exerc...
Oriol Roig, Jordi Cortadella, Marco A. Peña...
HASE
2007
IEEE
13 years 10 months ago
Model Validation using Automatically Generated Requirements-Based Tests
In current model-based development practice, validation that we are building a correct model is achieved by manually deriving requirements-based test cases for model testing. Mode...
Ajitha Rajan, Michael W. Whalen, Mats Per Erik Hei...
ICST
2008
IEEE
14 years 20 days ago
Quality of Automatically Generated Test Cases based on OCL Expressions
In this paper, we deal with coverage criteria for boundary testing. We focus on the automatic generation of boundary tests based on OCL expressions and evaluate the quality of the...
Stephan Weißleder, Bernd-Holger Schlingloff