90 search results - page 9 / 18 » Automatic generation of synthetic sequential benchmark circu... |
TCAD
1998
14 years 9 months ago
1998
—We study the effect of the controller on the testability of sequential circuits composed of controllers and data paths. We show that even when all the loops of the circuit have ...
VLDB
2004
ACM
15 years 2 months ago
2004
ACM
When query optimizers erroneously assume that database columns are statistically independent, they can underestimate the selectivities of conjunctive predicates by orders of magni...
IPPS
2010
IEEE
14 years 6 months ago
2010
IEEE
This paper focuses on parallelization of the classic static timing analysis (STA) algorithm for verifying timing characteristics of digital integrated circuits. Given ever-increasi...
ICDM
2003
IEEE
15 years 2 months ago
2003
IEEE
Abstract. We present a new distributed association rule mining (D-ARM) algorithm that demonstrates superlinear speed-up with the number of computing nodes. The algorithm is the fi...
DAC
1999
ACM
15 years 1 months ago
1999
ACM
As the sizes of general and special purpose processors increase rapidly, generating high quality manufacturing tests which can be run at native speeds is becoming a serious proble...