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DATE
2003
IEEE
109views Hardware» more  DATE 2003»
15 years 9 months ago
Fully Automatic Test Program Generation for Microprocessor Cores
Fulvio Corno, Gianluca Cumani, Matteo Sonza Reorda...
DFT
2003
IEEE
81views VLSI» more  DFT 2003»
15 years 9 months ago
A Digital and Wide Power Bandwidth H-Field Generator for Automatic Test Equipment
Fengming Zhang, Young-Jun Lee, T. Kane, Luca Schia...
HICSS
2003
IEEE
104views Biometrics» more  HICSS 2003»
15 years 9 months ago
Certification Support for Automatically Generated Programs
Johann Schumann, Bernd Fischer 0002, Michael W. Wh...